Level shifting apparatus and method of using the same

ABSTRACT

A level shifting apparatus includes a first capacitor, a first side of the first capacitor configured to receive a first voltage. The level shifting apparatus further includes an edge detector configured to receive the first voltage. The level shifting apparatus further includes an output inverter connected to a second side of the first capacitor, the output inverter configured to output an voltage-level shifted signal of the level shifting apparatus. The level shifting apparatus further includes a latch loop configured to receive feedback the output signal to an input of the output inverter, wherein the edge detector is configured to selectively interrupt feedback of the output signal to the input of the output inverter.

BACKGROUND

Level shifters are used to change a signal voltage level between theinput/output (I/O) device voltage, e.g., 3.3V, to the core devicevoltage, e.g., 0.9V. In some approaches, the level shifters are formedusing I/O devices. The I/O devices have a thicker gate dielectric layerin comparison with the core devices to withstand higher voltages.

In some approaches, the level shifters increase a voltage level of alogically high voltage from a first level to a second higher level. Insome approaches, these level shifters do not increase a voltage level ofa logically low voltage. The level shifters which maintain a samelogically low voltage level increase a voltage swing of an output signalin comparison with an input signal. In some approaches, the levelshifters include a bias circuit to increase the logically low voltagelevel.

In some approaches, the level shifters are formed using devices similarto the core devices. The core devices have a thinner gate dielectricthan the I/O devices. As a result, a voltage swing which is able todamage the core devices has a smaller range with respect to the I/Odevices.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1 is a schematic diagram of a level shifting apparatus inaccordance with some embodiments.

FIG. 2 is a schematic diagram of a level shifting apparatus inaccordance with some embodiments.

FIG. 3 is a schematic diagram of an edge detector in accordance withsome embodiments.

FIG. 4 is a graph of eye diagrams of a level shifting apparatus inaccordance with some embodiments.

FIG. 5 is a schematic diagram of a level shifting apparatus inaccordance with some embodiments.

FIG. 6 is a flow chart of a method of using a level shifting apparatusin accordance with one or more embodiments.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

FIG. 1 is a schematic diagram of a level shifting apparatus 100 inaccordance with some embodiments. Level shifting apparatus 100 includesan inverter INV1 configured to receive an input signal IN. A first sideof a first capacitor C1 is connected to an output of inverter INV1. Anedge detector 110 is also connected to the output of inverter INV1. Asecond side of first capacitor C1 is connected to an input of aninverter INV2. Inverter INV2 is configured to output an output signalOUT. A latch loop 120 is configured to feed back output signal OUT tothe input of inverter INV2. Latch loop 120 includes an inverter INV3configured to receive output signal OUT. Latch loop 120 further includesa transmission gate 125 connected to an output of inverter INV3. Edgedetector 110 is configured to selectively activate transmission gate 125to interrupt feedback of output signal OUT to inverter INV2.

Input signal IN has an input logically high voltage level and an inputlogically low voltage level. Output signal OUT has an output logicallyhigh voltage level and an output logically low voltage level. A voltagelevel of the output logically high voltage level is greater than theinput logically high voltage level. In some embodiments, the voltagelevel of the output logically high voltage level is twice the inputlogically high voltage level. A voltage level of the output logicallylow voltage level is greater than the input logically low voltage level.In some embodiments, the output logically low voltage level is equal tothe input logically high voltage level. In some embodiments, a voltageswing of input signal IN is equal to a voltage swing of output signalOUT.

Voltage levels are shifted from the voltage levels of input signal IN tothe voltage levels of the output signal OUT by INV1, C1, and INV2. Thelogically low voltage level of INV2 is set higher than that of INV1. Thedifference of the logically low voltage levels between INV2 and INV1 isstored in the first capacitor C1. The voltage levels at V1 and V2 nodesneed to be set to logically low voltage levels before use to avoidmalfunction. The output of inverter INV2 has the voltage levelscorresponding to the voltage levels of output signal OUT.

First capacitor C1 prevents a direct connection of a direct current (DC)between inverter INV1 and inverter INV2. Preventing the directconnection of DC helps to reduce reliability concerns with respect toinverter INV2 by reducing a voltage swing experienced by transistorswithin the inverter. A capacitance of first capacitor C1 is greater thana layout dependent capacitance. The layout dependent capacitance is thecapacitance resulting from parasitic effects within a layout design. Insome embodiments, a capacitance of first capacitor C1 is in a range oftens of femto Farads (fF). In some embodiments, first capacitor C1 has acapacitance greater than about 20 fF. In some embodiments, firstcapacitor C1 has a capacitance ranging from about 40 fF to about 50 fF.If the capacitance of first capacitor C1 is too low, level shifter 100experiences an increased sensitivity to layout-dependent parasiticcapacitors. If the capacitance of first capacitor C1 is too high, a sizeof level shifter 100 is increased without significant increase inperformance.

Edge detector 110 is configured to selectively deactivate transmissiongate 125 of latch loop 120 upon detecting a rising or falling edge ofinput signal IN. Edge detector 110 includes an input connected to theoutput of inverter INV1. Edge detector 110 includes two outputs. Eachoutput of the two outputs is connected to transmission gate 125 tocontrol conductivity of the transmission gate.

In some embodiments, level shifting apparatus 100 is positioned betweeninput/output (I/O) circuitry and core circuitry. Write signals from theI/O circuitry pass through level shifting apparatus 100 to be processedby the core circuitry in which the signal voltage swing does not exceedthe upper limit of the tolerable voltage levels for core devices. Byselectively deactivating transmission gate 125, edge detector 110 helpsto prevent contention between a current Iw induced by a received writesignal through C1 from input signal IN and a current Ik through latchloop 120. Preventing contention between current Iw and current Ik helpsto reduce a size of a driver as well as power consumption required bylevel shifting apparatus 100. Reducing a size of the driver in turndecreases an overall size of a device.

In some embodiments, a duration of an interruption of feedback throughlatch loop 120 ranges from about 5 picoseconds (ps) to about 10 ps. Insome embodiments, the duration of the interruption is about 15 ps. Theduration of the interruption is sufficiently long to permit the writesignal to pass through level shifting device 100. The duration of theinterruption is sufficiently short to help maintain a constant output byoutput signal OUT.

In comparison with other approaches, level shifting apparatus 100 iscapable of maintaining a same voltage swing for both input signal IN andoutput signal OUT. Maintaining the same voltage swing permits formationof level shifting apparatus 100 with devices which have thin gatedielectric layers similar to the core circuitry. The thin gatedielectric layers reduce a size of devices in level shifting apparatus100 in comparison with arrangements which include thicker gatedielectric layer devices. The smaller size of the devices also increasesa switching speed of devices in level shifting apparatus 100 incomparison with devices which have thicker gate dielectric layers. Insome embodiments, level shifting apparatus 100 is capable of operatingat frequencies up to about 10 gigabits per second (Gb/s).

Level shifting apparatus 100 has dependence to the frequency of inputsignal IN. In some instances, level shifting apparatus 100 experiencesattenuation of signals propagating through the level shifting apparatusas the frequency of input signal IN decreases. For example, as thefrequency of input signal IN decreases, a voltage swing at the firstside of first capacitor C1 will be smaller than that observed at thesecond side of the first capacitor increases, in some instances.Differences between first voltage V1 and second voltage V2 determinevoltage shifting levels between voltages of input signal IN and outputsignal OUT.

FIG. 2 is a schematic diagram of a level shifting apparatus 200 inaccordance with some embodiments. Similar devices in level shiftingapparatus 200 have a same reference number as that for level shiftingapparatus 100 increased by 100. In comparison with level shiftingapparatus 100, level shifting apparatus 200 includes a second capacitorC2 connected to the second side of first capacitor C1. A first side ofsecond capacitor C2 is configured to receive a voltage VDDQ. A secondside of second capacitor C2 is connected to the second side of firstcapacitor C1. In comparison with level shifting apparatus 100, levelshifting apparatus 200 is substantially free of signal attenuation dueto the frequency of input signal IN.

Level shifting apparatus 200 includes second capacitor C2 which helps tocontrol the second voltage V2 based on a capacitance ratio between firstcapacitor C1 and the second capacitor. Second voltage V2 is given by anequation:

${V\; 2} = \frac{\left( {{VDDQ}*C\; 2} \right) + \left( {V\; 1*C\; 1} \right)}{{C\; 1} + {C\; 2}}$

where VDDQ is a voltage level at the first side of second capacitor C2,C2 is a capacitance of the second capacitor, V1 is the voltage level atthe first side of first capacitor C1, and C1 is a capacitance of thefirst capacitor. Second voltage V2 is substantially independent of thefrequency of input signal IN which helps to maintain a preciserelationship without frequency dependent attenuation between the voltagelevel of the input signal and the voltage level of output signal OUT.

In some embodiments, second capacitor C2 has a capacitance greater thanabout 20 fF. If the capacitance of second capacitor C2 is too low, levelshifter 200 experiences an increased sensitivity to layout-dependentparasitic capacitance of the first capacitor and the second capacitor.If the capacitance of second capacitor C2 is too high, a size of levelshifter 200 is increased without significant increase in performance. Insome embodiments, the capacitance of first capacitor C1 in levelshifting apparatus 200 is less than the capacitance of first capacitorC1 in level shifting apparatus 100 (FIG. 1).

FIG. 3 is a schematic diagram of an edge detector 300 in accordance withsome embodiments. In some embodiments, edge detector 300 is part of alevel shifting apparatus, such as level shifting apparatus 100 (FIG. 1)or level shifting apparatus 200 (FIG. 2). Edge detector 300 includes afirst input IN1. A first input capacitor C10 is configured to receive aninput signal from first input IN1. A first terminal of a transistor M1is connected to a second side of input capacitor C10. A second terminalof transistor M1 is connected to a logically low voltage level VSSQ. Agate of transistor M1 is configured to receive a logically high voltagelevel VDDQ. The second side of first input capacitor C10 is alsoconnected to a gate of a transistor M2. A first terminal of transistorM2 is connected to a first output OUT1. A second terminal of thetransistor M2 is connected to logically low voltage level VSSQ. A gateof a transistor M3 is also connected to logically low voltage levelVSSQ. A first terminal of transistor M3 is connected to logically highvoltage level VDDQ. A second terminal of transistor M3 is connected tofirst output OUT1. A second input capacitor C12 is configured to receivean input signal from a second input IN2 at a first side of the secondinput capacitor. A second side of second input capacitor C12 isconnected to a gate of a transistor M4. A first terminal of transistorM4 is connected to logically low voltage level VSSQ. A second terminalof transistor M4 is connected to first output OUT1. A first terminal ofa transistor M5 is also connected to the second side of second inputcapacitor C12. A second terminal of transistor M5 is connected tologically low voltage VSSQ. A gate of transistor M5 is connected tologically high voltage VDDQ. An input of an inverter INV10 is connectedto first output OUT1. An output of inverter INV10 is connected to asecond output OUT2.

Edge detector 300 is configured to output a constant voltage levelexcept when a rising or falling edge is present at first input IN1 orsecond input IN2. Edge detector 300 is configured to output logicallyhigh voltage level VDDQ unless the rising or falling edge is present. Insome embodiments, edge detector 300 is configured to output logicallylow voltage level VSSQ unless the rising or falling edge is present.

Transistors M1, M3 and M5 are configured to be in a conductive stateduring an entire period of operation of edge detector 300. Transistor M1being in a conductive state during the entire period of operation causesa voltage at the gate of transistor M2 to be logically low when norising or falling edge is present. Transistor M5 being in a conductivestate during the entire period of operation causes a voltage at the gateof transistor M4 to be logically low when no rising or falling edge ispresent. Transistor M3 being in a conductive state during the entireperiod of operation causes a voltage at first output OUT1 to belogically high and a voltage at second output OUT2 to be logically lowwhen no rising or falling edge is present.

During operation, when a rising or falling edge is present at firstinput IN1, first input capacitor C10 causes a voltage at the gate oftransistor M2 to rapidly increase. The rapid increase at the gate oftransistor M2 causes transistor M2 to become conductive and connectfirst output OUT1 to logically low level VSSQ. As a result, the voltagelevel at first output OUT1 becomes logically low and the voltage levelat second output OUT2 becomes logically high. A duration which firstinput capacitor C10 takes to stabilize a voltage at the gate of M2ranges from about 0.5 ps to about 1.5 ps. In some embodiments, theduration which first input capacitor C10 takes to stabilize a voltage atthe gate of M2 is about 1.0 ps. In some embodiments, first inputcapacitor C10 has a capacitance ranging from about 10 fF to about 50 fF.If the capacitance is too small, the conductive time of M2 will becometoo short to generate a sufficiently wide pulse to turn on/off the latchloop 120 in FIG. 1 or the latch loop 220 in the FIG. 2. If thecapacitance is too large, a size of first input capacitor C10 isincreased without significant increase in performance.

When a rising or falling edge is present at second input IN2, secondinput capacitor C12 and transistor M4 operate in a manner similar tothat set forth above with respect to first input capacitor C10 andtransistor M2. In some embodiments, a capacitance of second inputcapacitor C12 is equal to the capacitance of first input capacitor C10.In some embodiments, the capacitance of second input capacitor C12differs from the capacitance of first input capacitor C10. In someembodiments, a size of transistor M4 is equal to a size of transistorM2. In some embodiments, the size of transistor M4 differs from the sizeof transistor M2.

FIG. 4 is a graph 400 of eye diagrams at the speed of 10 Gbit/sec of alevel shifting apparatus at various process and temperature skew cornersin accordance with some embodiments. Graph 400 indicates a voltageoutput by the level shifting apparatus versus a time, in someembodiments. In some embodiments, the level shifting apparatus is levelshifting apparatus 100 (FIG. 1) or level shifting apparatus 200 (FIG.2). Graph 400 includes a plot 410 for transistors in the TT productioncorner at a temperature of 25° C. The production corner is a measure ofswitching performance of transistor due to unavoidable productionvariations. The TT production corner means that both n-type transistorsand p-type transistors of the level shifting apparatus have a typicalswitching performance. In some embodiments, typical switchingperformance means an actual switching performance of a transistormatches a design switching performance within a predetermined threshold.Graph 400 includes a plot 420 for transistors in the SS productioncorner at a temperature of −40° C. The SS production corner means thatboth n-type transistors and p-type transistors of the level shiftingapparatus have a slow switching performance. In some embodiments, slowswitching performance means that an actual switching performance of atransistor is slower than the predetermined threshold less than thedesign switching performance. Graph 400 includes a plot 430 fortransistors in the SF production corner at a temperature of −40° C. TheSF production corner means that n-type transistors of the level shiftingapparatus have a slow switching performance and p-type transistors havea fast slow switching performance. In some embodiments, fast switchingperformance means that an actual switching performance of a transistoris faster than the predetermined threshold greater than the designswitching performance. Graph 400 includes a plot 440 for transistors inthe FS production corner at a temperature of −40° C. The FS productioncorner means that n-type transistors of the level shifting apparatushave a fast switching performance and p-type transistors have a slowswitching performance. Graph 400 includes a plot 450 for transistors inthe FF production corner at a temperature of −40° C. The FF productioncorner means that both n-type transistors and p-type transistors of thelevel shifting apparatus have a fast switching performance.

Plots 410-450 all indicate a clean eye at 10 Gb/s, meaning that anamount of jitter in the voltage signal is small. For example, plot 410indicates the level shifting apparatus has a jitter of about 0.5 ps. Inanother example, plot 420 indicates the level shifting apparatus has ajitter of about 0.75 ps. The low jitter values indicate that the levelshifting apparatus is able to function with a very short interruption ofa latch loop, e.g., latch loop 120 (FIG. 1) or latch loop 220 (FIG. 2),following a transition in a state of input signal IN.

FIG. 5 is a schematic diagram of a level shifting apparatus 500 inaccordance with some embodiments. Level shifting apparatus 500 includesa leakage divider 510 connected to an upshifted logically high voltageVDDH. Level shifting apparatus 500 further includes a skew inverter 520connected to the upshifted logically high voltage VDDH. Each of leakagedivider 510 and skew inverter 520 are connected to an input region 530.A buffering element 540 is configured to receive an output of skewinverter 520. Buffering element 540 is also configured to receive theupshifted logically high voltage VDDH and an upshifted logically lowvoltage VDD. Buffering element 540 is also configured to receive a biasvoltage PSUB. Based on the output of skew inverter 520, bufferingelement 540 is configured to output either upshifted logically highvoltage VDDH or upshifted logically low voltage VDD.

Leakage divider 510 includes a transistor M10 connected in series with atransistor M12. A gate and a first terminal of transistor M10 isconnected to an up-shifted logically high voltage VDDH. A secondterminal of transistor M10 is connected to a first terminal and a gateof transistor M12. A second terminal of transistor M12 is connected toinput region 530. A bulk of transistor M10 is biased by up-shiftedlogically high voltage VDDH. A bulk of transistor M12 is biased by avoltage at the first terminal of transistor M12.

Skew inverter 520 includes a transistor M20 connected in series with atransistor M22, a transistor M24 and a transistor M26. A gate of each oftransistors M20, M22, M24 and M26 is connected to the second terminal oftransistor M10. A second terminal of transistor M24 is connected to afirst terminal of transistor M26 and is configured to provide the outputof skew inverter 520. A second terminal of transistor M26 is connectedto input region 530. A bulk of each of transistors M20, M22 and M24 isbiased by up-shifted logically high voltage VDDH. A bulk of transistorM26 is biased by bias voltage PSUB

Input region 530 includes a transistor M30 having a first terminalconfigured to receive a non-shifted logically low voltage VSS. A secondterminal of transistor M30 is connected to leakage divider 510 and to afirst terminal of a transistor M32. A second terminal of transistor M32is connected to skew inverter 520 and is configured to receive upshiftedlogically low voltage VDD. A gate of transistor 30 and a gate oftransistor M32 are configured to receive an input signal IN′. A bulk oftransistor M30 is biased by non-shifted logically low voltage VSS. Abulk of transistor M32 is biased by upshifted logically low voltage VDD.

Buffering element 540 is configured to receive the output of skewinverter 520 and output an output signal OUT′ which has a voltage swingbetween upshifted logically high voltage VDDH and upshifted logicallylow voltage VDD. In some embodiments, buffering element 540 includes twoinverters connected in series.

In operation, upshifted logically high voltage VDDH maintains transistorM10 in a non-conductive state during an entire period of operation oflevel shifting apparatus 500. Charge transfer across transistor M10 is aresult of leakage current through transistor M10. Similarly, chargetransfer across transistor M12 is also a result of leakage currentacross transistor M12.

Conductivity of skew inverter 520 is controlled based on the leakagecurrent through leakage divider 510. When the voltage at the secondterminal of transistor M10 is logically high, transistors M20, M22 andM24 are in a non-conductive state and transistor M26 is in a conductivestate. As a result, the output of skew inverter 520 is connected toupshifted logically low voltage VDD. When the voltage at the secondterminal of transistor M10 is logically low, transistors M20, M22 andM24 are in a conductive stated and transistor M26 is in a non-conductivestate. As a result, the output of skew inverter 520 is connected toupshifted logically high voltage VDDH.

Input region 530 controls a leakage current across transistor M12. Wheninput signal IN′ is logically high, transistor M30 is in a conductivestate and transistor M32 is in a non-conductive state. As a result, thesecond terminal of transistor M12 is connected to non-shifted logicallylow voltage VSS which increases the leakage current across transistorM12 which lowers the voltage at the second terminal of transistor M10and activates transistors M20, M22 and M24. When input signal IN′ islogically low, transistor M30 is in a non-conductive state andtransistor M32 is in a conductive state. As a result, the secondterminal of transistor M12 is connected to upshifted logically lowvoltage VDD which decreases the leakage current across transistor M12which maintains a high voltage at the second terminal of transistor M10and activates transistor M26.

Buffering element 540 buffers the logical output of skew inverter 520.When input signal IN′ has a logically low voltage, buffer element 540outputs upshifted logically low voltage VDD as output signal OUT′. Wheninput signal IN′ has a logically high voltage, buffer element 540outputs upshifted logically high voltage VDDH as output signal OUT′. Insome embodiments, the logically high voltage for input signal IN′ isequal to upshifted logically low voltage VDD. In some embodiments,upshifted logically high voltage VDDH is equal to twice the logicallyhigh voltage of input signal IN′. A trip point for buffering element 540is tunable by adjusting a size of at least one transistor M20, M22, M24or M26 of skew inverter 520.

In comparison with level shifting apparatus 100 (FIG. 1) or levelshifting apparatus 200 (FIG. 2), level shifting apparatus 500 is free ofcapacitors. As a result, level shifting apparatus 500 has a smaller chipsize than level shifting apparatus 100 or level shifting apparatus 200.In some embodiments, level shifting apparatus 500 is usable for lowerspeed applications than level shifting apparatus 100 or level shiftingapparatus 200. In some embodiments, level shifting apparatus 500 isoperated at a switching speed on the order of megabytes per second(MB/s). In some embodiments, the switching speed of level shiftingapparatus ranges from about 10 Mb/s to about 20 Gb/s.

FIG. 6 is a flow chart of a method 600 of using a level shiftingapparatus in accordance with one or more embodiments. Method 600 beginswith operation 602 in which the level shifting apparatus receives aninput signal. The input signal, e.g., input signal IN (FIGS. 1 and 2),has a voltage swing. For example, in some embodiments, the voltage swingis from a logically low voltage of about 0V to a logically high voltageof about 0.8V, for a voltage swing of about 0.8V.

In operation 604, an upshifted output signal is output. The upshiftedoutput signal, e.g., output signal OUT (FIGS. 1 and 2), has a highervoltage level in comparison with the input signal. A logically highvoltage of the output signal is higher than a logically high voltage ofthe input signal. In addition, a logically low voltage of the outputsignal is higher than a logically low voltage of the input signal. Avoltage swing of the output signal is substantially equal to the voltageswing of the input signal. For example, in some embodiments, thelogically low voltage of the output signal is about 0.8 V and thelogically high voltage of the output signal is about 1.6V, for a voltageswing of about 0.8V. In some embodiments, the logically low voltage ofthe output signal is equal to the logically high voltage of the inputsignal. In some embodiments, the logically high voltage of the outputsignal is equal to twice the logically high voltage of the input signal.

In operation 606, the output signal is fed back within the levelshifting apparatus to maintain a constant voltage swing. Maintaining aconstant voltage swing helps to reduce the risk of damage to deviceswithin the level shifting apparatus and other circuitry connected to thelevel shifting apparatus. In some embodiments, the output signal is fedback using a latch loop, e.g., latch loop 120 (FIG. 1) or latch loop 220(FIG. 2).

In operation 608, the level shifting apparatus receives a write signal.The write signal includes a transition of the input signal IN from onelogic state to another.

In operation 610, the feedback of the output signal is interrupted. Thefeedback signal is interrupted to help avoid contention between acurrent generated by the transition of the input signal and a currentthrough the feedback. Interrupting the feedback signal results in lesspower consumption because a size of a driver associated with the levelshifting apparatus is decreased with respect to methods which do notinterrupt the feedback. In some embodiments, the feedback signal isinterrupted using an edge detector, e.g., edge detector 110 (FIG. 1),edge detector 210 (FIG. 2) or edge detector 300 (FIG. 3).

In operation 612, the feedback of the output signal is resumed.Following an interruption duration, the feedback of the output signal isresumed to once again maintain the voltage swing. In some embodiments,the interruption duration ranges from about 0.5 ps to about 1.5 ps. Insome embodiments, the interruption duration is about 1 ps. In someembodiments, the feedback signal is resumed using an edge detector,e.g., edge detector 110 (FIG. 1), edge detector 210 (FIG. 2) or edgedetector 300 (FIG. 3).

One of ordinary skill in the art would recognize that additionaloperations are able to be included in method 600 without departing fromthe scope of this description. One of ordinary skill in the art wouldalso recognize that an order of operation of the above describedoperations is able to be changed without departing from the scope ofthis description.

One aspect of this description relates to a level shifting apparatus.The level shifting apparatus includes a first capacitor, a first side ofthe first capacitor configured to receive a first voltage. The levelshifting apparatus further includes an edge detector configured toreceive the first voltage. The level shifting apparatus further includesan output inverter connected to a second side of the first capacitor,the output inverter configured to output an output signal of the levelshifting apparatus. The level shifting apparatus further includes alatch loop configured to receive feedback the output signal to an inputof the output inverter, wherein the edge detector is configured toselectively interrupt feedback of the output signal to the input of theoutput inverter.

Another aspect of this description relates to a level shiftingapparatus. The level shifting apparatus includes a leakage dividerconnected to an upshifted logically high voltage, and a skew inverterconnected to the upshifted logically high voltage. The level shiftingapparatus further includes an input region connected to the leakagedivider and the skew inverter, wherein the input region is furtherconnected to a non-upshifted logically low voltage and an upshiftedlogically low voltage. The level shifting apparatus further includes abuffering element connected to an output of the skew inverter, whereinthe level shifting apparatus if free of capacitors.

Still another aspect of this description relates to a method of using alevel shifting apparatus. The method includes outputting an upshiftedoutput signal in response to an input signal, wherein a voltage swing ofthe output signal is substantially equal to a voltage of the inputsignal. The method further comprises feeding the output signal back tothe level shifting apparatus, and interrupting the feeding back of theoutput signal in response to a transition of the input signal. Themethod further includes resuming feeding back the output signal to thelevel shifting apparatus following an interruption duration.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

1. A level shifting apparatus comprising: a first capacitor, a firstside of the first capacitor configured to receive a first voltage; anedge detector configured to receive the first voltage; an outputinverter connected to a second side of the first capacitor, the outputinverter configured to output an output signal of the level shiftingapparatus; a latch loop configured to feed back the output signal to aninput of the output inverter, wherein the edge detector is configured toselectively interrupt feedback of the output signal to the input of theoutput inverter.
 2. The level shifting apparatus of claim 1, wherein thelatch loop comprises: a feedback inverter, an input of the feedbackinverter connected to an output of the output inverter; and atransmission gate connected between an output of the feedback inverterand the input of the output inverter.
 3. The level shifting apparatus ofclaim 2, wherein the edge detector is connected to the transmissiongate.
 4. The level shifting apparatus of claim 1, further comprising aninput inverter configured to receive an input signal, an output of theinput inverter connected to the first side of the first capacitor. 5.The level shifting apparatus of claim 1, wherein the edge detector isconnected to the first side of the first capacitor.
 6. The levelshifting apparatus of claim 1, wherein a capacitance of the firstcapacitor is greater than a layout dependent parasitic capacitance. 7.The level shifting apparatus of claim 1, wherein a capacitance of thefirst capacitor is in a range of tens of femtofarads (fF).
 8. The levelshifting apparatus of claim 1, wherein the edge detector is configuredto interrupt the feedback of the output signal for a duration rangingfrom about 0.5 picoseconds (ps) to about several pico-seconds (ps). 9.The level shifting apparatus of claim 1, wherein the edge detectorcomprises: a first input capacitor configured to receive a first edgeinput at a first side of the first input capacitor; a first transistorconnected between a logically low voltage and a second side of the firstinput capacitor; a second transistor connected between the logically lowvoltage and a first output of the edge detector, wherein a gate of thesecond transistor is connected to the second side of the first inputcapacitor; a third transistor connected between a logically high voltageand the first output of the edge detector; a second input capacitorconfigured to receive a second edge input at a first side of the secondinput capacitor; a fourth transistor connected between the logically lowvoltage and the first output of the edge detector, wherein a gate of thefourth transistor is connected to a second side of the second inputcapacitor; and a fifth transistor connected between the logically lowvoltage and the second side of the second input capacitor.
 10. The levelshifting apparatus of claim 9, wherein the edge detector furthercomprises an edge inverter connected to the first output of the edgedetector and configured to output a second output of the edge detector.11. The level shifting apparatus of claim 9, wherein the firsttransistor, the third transistor and the fifth transistor are eachconfigured to be conductive during an entire period of operation. 12.The level shifting apparatus of claim 1, further comprising a secondcapacitor, wherein a first side of the second capacitor is connected toa logically high voltage, and a second side of the second capacitor isconnected to the second side of the first capacitor.
 13. The levelshifting apparatus of claim 12, wherein a capacitance of the secondcapacitor is greater than a layout dependent parasitic capacitance. 14.The level shifting apparatus of claim 12, wherein a capacitance of thesecond capacitor is in a range of tens of fento farads (fF). 15-19.(canceled)
 20. A method of using a level shifting apparatus, the methodcomprising: outputting an upshifted output signal in response to aninput signal, wherein a voltage swing of the output signal issubstantially equal to a voltage of the input signal; feeding the outputsignal back to the level shifting apparatus; interrupting the feedingback of the output signal in response to a transition of the inputsignal; and resuming feeding back the output signal to the levelshifting apparatus following an interruption duration.
 21. A levelshifting apparatus comprising: a first inverter configured to receive aninput signal; a first capacitor connected to the first inverter, a firstside of the first capacitor configured to receive a first voltage fromthe first inverter; an edge detector connected to the first side of thefirst capacitor, the edge detector configured to receive the firstvoltage; a second inverter connected to a second side of the firstcapacitor, the second inverter configured to output an output signal ofthe level shifting apparatus; a latch loop configured to feed back theoutput signal to an input of the second inverter, wherein the edgedetector is configured to selectively interrupt feedback of the outputsignal to the input of the second inverter.
 22. The level shiftingapparatus of claim 21, further comprising a second capacitor, wherein afirst side of the second capacitor is connected to a logically highvoltage, and a second side of the second capacitor is connected to thesecond side of the first capacitor.
 23. The level shifting apparatus ofclaim 21, wherein the edge detector comprises: a first input capacitorconfigured to receive a first edge input at a first side of the firstinput capacitor; a first transistor connected between a logically lowvoltage and a second side of the first input capacitor; a secondtransistor connected between the logically low voltage and a firstoutput of the edge detector, wherein a gate of the second transistor isconnected to the second side of the first input capacitor; a thirdtransistor connected between a logically high voltage and the firstoutput of the edge detector; a second input capacitor configured toreceive a second edge input at a first side of the second inputcapacitor; a fourth transistor connected between the logically lowvoltage and the first output of the edge detector, wherein a gate of thefourth transistor is connected to a second side of the second inputcapacitor; and a fifth transistor connected between the logically lowvoltage and the second side of the second input capacitor.
 24. The levelshifting apparatus of claim 23, wherein the edge detector furthercomprises a third inverter connected to the first output of the edgedetector and configured to output a second output of the edge detector.25. The level shifting apparatus of claim 21, wherein the latch loopcomprises: a feedback inverter, an input of the feedback inverterconnected to an output of the second inverter; and a transmission gateconnected between an output of the feedback inverter and the input ofthe second inverter.